Brocorens, P., Dubois, P., Gillis, P., Renoirt, J.-M., Lazzaroni, R., Wautelet, M., Dusoulier, J., Bazet-Simoni, C., Gandin, E., Leboutte, F., & Servigne, P. (2013). Voici venue l'ère du pétrole cher. Le Soir. |
Wautelet, M., & D'amelio, N. (2011). Le Principe de précaution en tant que principe de démocratie délibérative dans l'UE. Lansman Editeur. |
  | Van Overschelde, O., Guisbiers, G., & Wautelet, M. (04 August 2009). Nanocrystallisation of anatase or rutile TiO2 by laser treatment. Journal of Physical Chemistry. C, Nanomaterials and interfaces, 113 (34), 15343-15345. doi:10.1021/jp905163j  Peer reviewed vérifié par ORBi |
  | VanOverschelde, O., Guisbiers, G., Hamadi, F., Hemberg, A., Snyders, R., & Wautelet, M. (18 November 2008). Alternative to classic annealing treatments for fractally patterned TiO2 thin films. Journal of Applied Physics, 104 (10), 103106-103113. doi:10.1063/1.3021161 Peer reviewed vérifié par ORBi |
 | Van Overschelde, O., Guisbiers, G., Hamadi, F., Hemberg, A., Snyders, R., & Wautelet, M. (18 November 2008). Alternative to classic annealing treatments for fractally patterned TiO2 thin films. Journal of Applied Physics, 104. Peer reviewed vérifié par ORBi |
 | Van Overschelde, O., Boisdequin, J. M., Leclère, P., & Wautelet, M. (01 August 2008). Excimer-Laser Induced Structural Transformations of TiO2 Thin Films. Physica Status Solidi C. Current Topics in Solid State Physics, 5 (10), 3255-3258. doi:10.1002/pssc.200779518 Peer reviewed vérifié par ORBi |
 | Duvivier, D., Van Overschelde, O., & Wautelet, M. (05 March 2008). Nanogeometry. European Journal of Physics, 29 (3), 467-474. doi:10.1088/0143-0807/29/3/007 Peer reviewed vérifié par ORBi |
 | Guisbiers, G., Van Overschelde, O., & Wautelet, M. (01 March 2008). Theoretical investigation of size and shape effects on the melting temperature and energy bandgap of TiO2 nanostructures. Applied Physics Letters, 92 (10), 103121-3. doi:10.1063/1.2897297 Peer reviewed vérifié par ORBi |
 | Guisbiers, G., Kazan, M., Van Overschelde, O., Wautelet, M., & Pereira, S. (22 February 2008). Mechanical and Thermal Properties of Metallic and Semiconductive Nanostructures. Journal of Physical Chemistry. C, Nanomaterials and interfaces, 112 (11), 4097-4103. doi:10.1021/jp077371n Peer reviewed vérifié par ORBi |
 | Van Overschelde, O., Snyders, R., & Wautelet, M. (15 December 2007). Crystallisation of TiO2 thin films induced by excimer laser irradiation. Applied Surface Science, 254 (4), 971-974. doi:10.1016/j.apsusc.2007.08.018 Peer reviewed vérifié par ORBi |
Guisbiers, G., & Wautelet, M. (03 August 2007). Materials selection for micro-electromechanical systems. Materials and Design, 28. |
 | Van Overschelde, O., Guisbiers, G., & Wautelet, M. (31 July 2007). Micro-structuring of TiO2 thin films by laser-assisted diffraction processing. Applied Surface Science, 253 (Issue 19), 7890-7894. doi:10.1016/j.apsusc.2007.02.072 Peer reviewed vérifié par ORBi |
 | Wautelet, M., & Duvivier, D. (30 July 2007). The characteristic dimensions of the nanoworld. European Journal of Physics, 28, 953-959. Peer reviewed vérifié par ORBi |
 | Guisbiers, G., Van Overschelde, O., & Wautelet, M. (01 June 2007). Nanoparticulate origin of intrinsic residual stress in thin films. Acta Materialia, 55 (10), 3541-3546. doi:10.1016/j.actamat.2007.02.003 Peer reviewed vérifié par ORBi |
 | Guisbiers, G., Abudukelimu, G., Clement, F., & Wautelet, M. (01 April 2007). Effects of Shape on the Phase Stability of Nanoparticles. Journal of Computational and Theoretical Nanoscience, 4 (2), 309-315. doi:10.1166/jctn.2007.2320 Peer reviewed vérifié par ORBi |
 | Guisbiers, G., Van Overschelde, O., & Wautelet, M. (21 March 2007). Nanoparticulate origin of intrinsic residual stress in thin films. Acta Materialia, 55. Peer reviewed vérifié par ORBi |
 | Van Overschelde, O., Guisbiers, G., & Wautelet, M. (2007). Micro-structuring of TiO2 thin films by laser-assisted diffraction processing. Applied Surface Science. Peer reviewed vérifié par ORBi |
 | Guisbiers, G., Van Overschelde, O., Wautelet, M., Leclère, P., & Lazzaroni, R. (02 February 2007). Fractal dimension, growth mode and residual stress of metal thin films. Journal of Physics: D Applied Physics, 40. Peer reviewed vérifié par ORBi |
Guisbiers, G., Van Overschelde, O., & Wautelet, M. (25 January 2007). Materials selection for thin films for radio frequency microelectromechanical systems. Materials and Design, 28. Peer reviewed vérifié par ORBi |
 | Guisbiers, G., Van Overschelde, O., & Wautelet, M. (01 January 2007). Materials selection for thin films for radio frequency microelectromechanical systems. Materials and Design, 28 (Issue 1), 1994-1997. doi:10.1016/j.matdes.2005.05.012 Peer reviewed vérifié par ORBi |
 | Van Overschelde, O., & Wautelet, M. (01 October 2006). Diffraction-aided laser-induced microstructuring of thin TiO2 films on glass. Applied Physics Letters, 89 (Issue 16), 161114-3. doi:10.1063/1.2364462 Peer reviewed vérifié par ORBi |
 | Abudukelimu, G., Guisbiers, G., & Wautelet, M. (01 June 2006). Theoretical phase diagrams of nanowires. Journal of Materials Research, 21. Peer reviewed vérifié par ORBi |
 | Van Overschelde, O., Dinu, S., Guisbiers, G., Monteverde, F., Nouvellon, C., & Wautelet, M. (30 April 2006). Excimer laser ablation of thin titanium oxide films on glass. Applied Surface Science, 252 (Issue 13), 4722-4727. doi:10.1016/j.apsusc.2005.07.147 Peer reviewed vérifié par ORBi |
 | Van Overschelde, O., Dinu, S., Guisbiers, G., Monteverde, F., Nouvellon, C., & Wautelet, M. (30 April 2006). Excimer laser ablation of thin titanium oxide films on glass. Applied Surface Science, 252. Peer reviewed vérifié par ORBi |
 | Guisbiers, G., & Wautelet, M. (24 March 2006). Size, shape and stress effects on the melting temperature of nano-polyhedral grains on a substrate. Nanotechnology, 17. Peer reviewed vérifié par ORBi |
 | Duvivier, D., & Wautelet, M. (22 March 2006). From the microworld to King Kong. Physics Education, 41, 386-390. Peer reviewed vérifié par ORBi |
 | Guisbiers, G., Strehle, S., Van Overschelde, O., & Wautelet, M. (2006). Residual stresses in Ta, Mo, Al and Pd thin films deposited by e-beam evaporation process on Si and Si/SiO2 substrates [Paper presentation]. 8th International Workshop on Stress-Induced Phenomena in Metallization, Dresden, Germany. |
 | Guisbiers, G., Strehle, S., & Wautelet, M. (24 August 2005). Modeling of residual stresses in thin films deposited by electron beam evaporation. Microelectronic Engineering, 82. Peer reviewed vérifié par ORBi |
Van Overschelde, O., & Wautelet, M. (10 June 2005). Self-diffraction in a CCD camera. European Journal of Physics, 26, 15-17. doi:10.1088/0143-0807/26/5/L01 Peer reviewed vérifié par ORBi |
Guisbiers, G., Strehle, S., Van Overschelde, O., & Wautelet, M. (2005). Residual stresses in Ta, Mo, Al and Pd thin films deposited by E-beam evaporation process on Si and Si/SiO2 substrates [Paper presentation]. 8th International Workshop on Stress-Induced Phenomena in Metallization, Dresden, Germany. |
 | Guisbiers, G., & Wautelet, M. (2003). Macro-, micro- et nanosystèmes: des physiques différentes? [Paper presentation]. Congrès français de Thermique, SFT2003, Grenoble, France. |
Del Re, M., Gouttebaron, R., Dauchot, J.-P., Leclère, P., Lazzaroni, R., Wautelet, M., & Hecq, M. (28 June 2002). Growth and morphology of magnetron sputter deposited silver films. Surface and Coatings Technology, 151-152, 86-90. Peer reviewed vérifié par ORBi |