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In-Situ Measurement of Dielectric Material Properties: Perspectives for Integrated Digitally Calibrated Built-In-Self-Sensor Solutions

Leysenne, L.; Wane, S.; Coq Germanicus, R. et al.

2013 • In Proceedings of the 43rd European Microwave Conference (EuMCn, October 2013, Nuremberg, Germany), p. 76-79

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cmn654.pdf

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