In-Situ Measurement of Dielectric Material Properties: Perspectives for Integrated Digitally Calibrated  Built-In-Self-Sensor Solutions

Leysenne, L.; Wane, S.; Coq Germanicus, R.; Pasquet, D.; Descamps, P.; Lahbib, I.; Lesénéchal, D.; Leclère, Philippe

Article (Scientific journals)

In-Situ Measurement of Dielectric Material Properties: Perspectives for Integrated Digitally Calibrated Built-In-Self-Sensor Solutions

Leysenne, L.; Wane, S.; Coq Germanicus, R. et al.

2013 • In Proceedings of the 43rd European Microwave Conference (EuMCn, October 2013, Nuremberg, Germany), p. 76-79

Peer reviewed

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https://hdl.handle.net/20.500.12907/22755

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Details

Disciplines :

Chemistry

Author, co-author :

Leysenne, L.

Wane, S.

Coq Germanicus, R.

Pasquet, D.

Descamps, P.

Lahbib, I.

Lesénéchal, D.

Leclère, Philippe ; Université de Mons > Faculté des Sciences > Chimie des matériaux nouveaux

Language :

English

Title :

In-Situ Measurement of Dielectric Material Properties: Perspectives for Integrated Digitally Calibrated Built-In-Self-Sensor Solutions

Publication date :

07 October 2013

Journal title :

Proceedings of the 43rd European Microwave Conference (EuMCn, October 2013, Nuremberg, Germany)

ISSN :

978-2-87487-031-6

Pages :

76-79

Peer reviewed :

Peer reviewed

Research unit :

S817 - Chimie des matériaux nouveaux

Research institute :

R400 - Institut de Recherche en Science et Ingénierie des Matériaux

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