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Article (Scientific journals)
In-Situ Measurement of Dielectric Material Properties: Perspectives for Integrated Digitally Calibrated Built-In-Self-Sensor Solutions
Leysenne, L.; Wane, S.; Coq Germanicus, R. et al.
2013 • In Proceedings of the 43rd European Microwave Conference (EuMCn, October 2013, Nuremberg, Germany), p. 76-79
Peer reviewed
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Disciplines :
Chemistry
Author, co-author :
Leysenne, L.
Wane, S.
Coq Germanicus, R.
Pasquet, D.
Descamps, P.
Lahbib, I.
Lesénéchal, D.
Leclère, Philippe  ;  Université de Mons > Faculté des Sciences > Chimie des matériaux nouveaux
Language :
English
Title :
In-Situ Measurement of Dielectric Material Properties: Perspectives for Integrated Digitally Calibrated Built-In-Self-Sensor Solutions
Publication date :
07 October 2013
Journal title :
Proceedings of the 43rd European Microwave Conference (EuMCn, October 2013, Nuremberg, Germany)
ISSN :
978-2-87487-031-6
Pages :
76-79
Peer reviewed :
Peer reviewed
Research unit :
S817 - Chimie des matériaux nouveaux
Research institute :
R400 - Institut de Recherche en Science et Ingénierie des Matériaux
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