Apple Defect Detection and Quality Classification with MLP-Neural Networks

Paper published in a journal (Scientific congresses and symposiums)

Unay, Devrim; Gosselin, Bernard

2002

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https://hdl.handle.net/20.500.12907/15596

prorisc02_dubg.pdf

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Disciplines :

Computer science
Electrical & electronics engineering

Author, co-author :

Unay, Devrim

Gosselin, Bernard ; Université de Mons > Faculté Polytechnique > Information, Signal et Intelligence artificielle

Language :

English

Title :

Apple Defect Detection and Quality Classification with MLP-Neural Networks

Publication date :

01 January 2002

Event name :

IEEE ProRisc2002

Event place :

Eindhoven, Netherlands

Event date :

2002

Research unit :

F105 - Information, Signal et Intelligence artificielle

Commentary :

6 p

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