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Optical Characterization of Multilayered InxGa1-xN/GaN and GaN Structures grown by MOCVD on Sapphire Substrates
Gokarna, A.; Dogheche, E.; Decoster, D. et al.
2009
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https://hdl.handle.net/20.500.12907/15761
 

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Disciplines :
Materials science & engineering
Physics
Author, co-author :
Gokarna, A.
Dogheche, E.
Decoster, D.
Dumont, Eric ;  Université de Mons > Faculté Polytechnique > Service de Thermodynamique, Physique mathématiques
Teng, J.
Liu, W.
Chua, S.J.
Language :
English
Title :
Optical Characterization of Multilayered InxGa1-xN/GaN and GaN Structures grown by MOCVD on Sapphire Substrates
Publication date :
28 June 2009
Event name :
ICMAT 2009 Conference
Event place :
Singapore
Event date :
2009
Research unit :
F506 - Thermodynamique, Physique mathématiques
Research institute :
R400 - Institut de Recherche en Science et Ingénierie des Matériaux
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