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Poster (Scientific congresses and symposiums)
Detection of outliers in spectroscopic ellipsometry maps: a multivariate approach based on Mahalanobis distance
Voué, Michel
20127th Ellipsometry Workshop
 

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Abstract :
[en] End-products in steel industry are usually protected by a lubricant layer coated by elec-trospray. As the metal substrates are rough, measuring the thickness of the lubricant layer and more specifically identifying spots that correspond to an excess of lubricant remains a challenge
Research center :
CRPM - Physique des matériaux
Disciplines :
Physics
Author, co-author :
Voué, Michel ;  Université de Mons > Faculté des Sciences > Service de Physique des matériaux et Optique
Language :
English
Title :
Detection of outliers in spectroscopic ellipsometry maps: a multivariate approach based on Mahalanobis distance
Publication date :
09 January 2012
Number of pages :
1
Event name :
7th Ellipsometry Workshop
Event place :
Leipzig, Germany
Event date :
2012
Research unit :
S878 - Physique des matériaux et Optique
Research institute :
R400 - Institut de Recherche en Science et Ingénierie des Matériaux
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since 09 January 2012

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