In situ characterization of chemically deposited nickel thin films on float glass by ellipsometry

Paper published in a journal (Scientific congresses and symposiums)

Dumont, Eric; Dugnoille, B.

1996

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https://hdl.handle.net/20.500.12907/4010

J_non_Cryst_Solids_1997.pdf

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Keywords :

General Energy

Disciplines :

Materials science & engineering
Physics

Author, co-author :

Dugnoille, B.

Language :

English

Title :

In situ characterization of chemically deposited nickel thin films on float glass by ellipsometry

Publication date :

30 October 1996

Event name :

1st International Conference on coatings on Glass

Event place :

Saarbrücken, Germany

Event date :

1996

Research unit :

F502 - Science des Matériaux

Research institute :

R400 - Institut de Recherche en Science et Ingénierie des Matériaux

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since 19 January 2011

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