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Influence of Passive Oscillator Component Variation on OBT Sensitivity in OTAs
Petrashin, Pablo; Toledo, Luis; Vázquez, Carlos et al.
2018
 

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Research center :
CRTI - Centre de Recherche en Technologie de l'Information
Disciplines :
Electrical & electronics engineering
Author, co-author :
Petrashin, Pablo
Toledo, Luis
Vázquez, Carlos
Stander, Tinus
Dualibe, Fortunato ;  Université de Mons > Faculté Polytechnique > Service d'Electronique et Microélectronique
Language :
English
Title :
Influence of Passive Oscillator Component Variation on OBT Sensitivity in OTAs
Publication date :
16 March 2018
Event name :
19th IEEE Latin American Test Symposium 2018
Event place :
Sao Paulo, Brazil
Event date :
2018
Research unit :
F109 - Electronique et Microélectronique
Research institute :
R450 - Institut NUMEDIART pour les Technologies des Arts Numériques
Name of the research project :
Development of self-testing techniques for microwave microelectronics in harsh environment - Fédération Wallonie Bruxelles
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since 23 December 2018

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