[en] In this study, the optical properties of Ag-doped polymer films were studied using SE as a function of the thick-ness of the film. 20nm-thick and 300nm-thick films with a high Ag content were considered. The topography of the films was studied by atomic force microscopy.
Research center :
CRPM - Physique des matériaux
Disciplines :
Physics
Author, co-author :
Voué, Michel ; Université de Mons > Faculté des Sciences > Service de Physique des matériaux et Optique
Abdessemed, Lamia ; Université de Mons > Faculté des Sciences > Physique des matériaux et Optique
Language :
English
Title :
Optical behavior of thick and thin dielectric films embedding noble metal nanoparticles
Publication date :
09 January 2012
Number of pages :
1
Event name :
7th Ellipsometry Workshop
Event place :
Leipzig, Germany
Event date :
2012
Research unit :
S878 - Physique des matériaux et Optique
Research institute :
R400 - Institut de Recherche en Science et Ingénierie des Matériaux
