[en] Impulse noise is known to be the most degrading factor in Digital Subscriber Line (xDSL) technologies. The increasing demand in transmission capacity and communication reliability have driven new studies about the
impulse noise behaviour on copper pairs. Based on impulse noise statistics issued from a field trial in Germany, this paper
studies the way to include it, in conjunction with white gaussian noise, in the analytic expressions of the bit error rate. Taking as hypothesis that white gaussian noise contribution during the impulse duration is negligible, we developed
formulas in the case of NRZ and M-QAM (M = 4)
modulations. For the latter case, we use a Generalized Error Distribution (GED) to represent the amplitude probability
density function of the impulse noise on both I & Q components, as suggested by the literature.
Research center :
CRTI - Centre de Recherche en Technologie de l'Information
Disciplines :
Electrical & electronics engineering
Author, co-author :
Moeyaert, Véronique ; Université de Mons > Faculté Polytechnique > Electromagnétisme et Télécommunications
Mégret, Patrice ; Université de Mons > Faculté Polytechnique > Service d'Electromagnétisme et Télécommunications
Froidure, J.-C.
Blondel, Michel
Language :
English
Title :
Joint Impact of Gaussian and Impulse Noise on the Error Probability of Baseband and M-QAM signals
Publication date :
08 October 2001
Event name :
IEEE Symposium on Communications and Vehicular Technology in the Benelux
Event place :
Delft, Netherlands
Event date :
2001
Research unit :
F108 - Electromagnétisme et Télécommunications
Research institute :
R300 - Institut de Recherche en Technologies de l'Information et Sciences de l'Informatique
