Abstract :
[EN] We studied the dewetting process of thin polystyrene (PS) films on silicon sub strates, coated with a thin, irreversibly adsorbed polydimethylsiloxane (PDMS)
layer, by optical microscopy and atomic force microscopy. Besides demonstrating
the exceptional potential of dewetting for a sensitive characterization of rheological
properties of PS thin films, characterized by a stress-relaxation time, s1, we focused
on the influence of the frictional behaviour (energy dissipation mechanism) at the
interface between the PDMS-coated silicon wafer and the PS film on the dewetting
process. Our results show that the initial stages of dewetting depend sensitively on
the thickness and the way the PDMS layer was adsorbed. The maximum width of
the dewetting rim at s1 increased with increasing PDMS layer thickness, which
can be interpreted as an increase of the effective, velocity-dependent slippage
length. Interestingly, s1 was found to be almost independent of the substrate
properties. Our results demonstrate that dewetting is a really powerful approach
for rheological and frictional studies of thin polymer films
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