Mapping of High Modulus Materials at the Nanoscale: Comparative Study between by Atomic Force Microscopy and Nanoindentation

Coq-Germanicus, R.; Mercier, David; Agrebi, F.; Fèvre, M.; Mariolle, Denis; Descamps, Philippe; Leclère, Philippe

Article (Scientific journals)

Coq-Germanicus, R.; Mercier, David; Agrebi, F. et al.

2020 • In Journal of Microscopy

Peer Reviewed verified by ORBi

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https://hdl.handle.net/20.500.12907/16513

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Details

Research center :

CIRMAP - Centre d'Innovation et de Recherche en Matériaux Polymères

Disciplines :

Chemistry

Author, co-author :

Coq-Germanicus, R.

Mercier, David

Agrebi, F.

Fèvre, M.

Mariolle, Denis

Descamps, Philippe

Leclère, Philippe ; Université de Mons > Faculté des Sciences > Chimie des matériaux nouveaux

Language :

English

Title :

Mapping of High Modulus Materials at the Nanoscale: Comparative Study between by Atomic Force Microscopy and Nanoindentation

Publication date :

03 June 2020

Journal title :

Journal of Microscopy

ISSN :

0022-2720

eISSN :

1365-2818

Publisher :

Blackwell, Oxford, United Kingdom

Peer reviewed :

Peer Reviewed verified by ORBi

Research unit :

S817 - Chimie des matériaux nouveaux

Research institute :

R400 - Institut de Recherche en Science et Ingénierie des Matériaux

Available on ORBi UMONS :

since 03 July 2020

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