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Article (Scientific journals)
Mapping of High Modulus Materials at the Nanoscale: Comparative Study between by Atomic Force Microscopy and Nanoindentation
Coq-Germanicus, R.
;
Mercier, David
;
Agrebi, F.
et al.
2020
•
In
Journal of Microscopy
Peer Reviewed verified by ORBi
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https://hdl.handle.net/20.500.12907/16513
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Research center :
CIRMAP - Centre d'Innovation et de Recherche en Matériaux Polymères
Disciplines :
Chemistry
Author, co-author :
Coq-Germanicus, R.
Mercier, David
Agrebi, F.
Fèvre, M.
Mariolle, Denis
Descamps, Philippe
Leclère, Philippe
;
Université de Mons > Faculté des Sciences > Chimie des matériaux nouveaux
Language :
English
Title :
Mapping of High Modulus Materials at the Nanoscale: Comparative Study between by Atomic Force Microscopy and Nanoindentation
Publication date :
03 June 2020
Journal title :
Journal of Microscopy
ISSN :
0022-2720
Publisher :
Blackwell, Oxford, United Kingdom
Peer reviewed :
Peer Reviewed verified by ORBi
Research unit :
S817 - Chimie des matériaux nouveaux
Research institute :
R400 - Institut de Recherche en Science et Ingénierie des Matériaux
Available on ORBi UMONS :
since 03 July 2020
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