Article (Scientific journals)
Temperature Dependence of Charge Localization in High-Mobility, Solution-Crystallized Small Molecule Semiconductors Studied by Charge Modulation Spectroscopy
Meneau, A.Y.B.; Olivier, Yoann; Backlund, T. et al.
2016In Advanced Functional Materials, 26, p. 2326-2333
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Research center :
CIRMAP - Centre d'Innovation et de Recherche en Matériaux Polymères
Disciplines :
Chemistry
Author, co-author :
Meneau, A.Y.B.
Olivier, Yoann ;  Université de Mons > Faculté des Sciences > Chimie des matériaux nouveaux
Backlund, T.
James, M.
Breiby, D.W.
Andreasen, J.W.
Sirringhaus, H.
Language :
English
Title :
Temperature Dependence of Charge Localization in High-Mobility, Solution-Crystallized Small Molecule Semiconductors Studied by Charge Modulation Spectroscopy
Publication date :
23 December 2016
Journal title :
Advanced Functional Materials
ISSN :
1616-301X
Publisher :
John Wiley & Sons, United Kingdom
Volume :
26
Pages :
2326-2333
Peer reviewed :
Peer Reviewed verified by ORBi
Research unit :
S817 - Chimie des matériaux nouveaux
Research institute :
R400 - Institut de Recherche en Science et Ingénierie des Matériaux
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since 23 December 2016

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