Using Scattering Parameters and the gm/ID MOST Ratio for Characterisation and Design of RF Circuits

Article (Scientific journals)

Castagnola, Juan Luis; Dualibe, Fortunato; Garcia Vazquez, Hugo

2016 • In IEEE International Midwest Symposium on Circuits and Systems

Peer reviewed

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https://hdl.handle.net/20.500.12907/41896

PID4383969.pdf

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Disciplines :

Electrical & electronics engineering

Author, co-author :

Castagnola, Juan Luis

Dualibe, Fortunato ; Université de Mons > Faculté Polytechnique > Electronique et Microélectronique

Garcia Vazquez, Hugo ; Université de Mons > Faculté Polytechnique > Electronique et Microélectronique

Language :

English

Title :

Using Scattering Parameters and the gm/ID MOST Ratio for Characterisation and Design of RF Circuits

Publication date :

19 October 2016

Journal title :

IEEE International Midwest Symposium on Circuits and Systems

ISSN :

1548-3746

Peer reviewed :

Peer reviewed

Research unit :

F109 - Electronique et Microélectronique

Research institute :

R450 - Institut NUMEDIART pour les Technologies des Arts Numériques
R200 - Institut de Recherche en Energie

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