Article (Scientific journals)
Chain Length Dependence of the Dielectric Constant and Polarizability in Conjugated Organic Thin Films.
VAN DYCK, Colin; Marks, Tobin J; Ratner, Mark A
2017In ACS Nano, 11 (6), p. 5970-5981
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Keywords :
chain length; conjugation; depolarization; dielectric constant; permittivity; thickness; thin film; Chain-length dependence; Conjugated molecules; Dielectric performance; Exchange-correlation functionals; Molecular assembly; Organic thin films; Materials Science (all); Engineering (all); Physics and Astronomy (all); General Physics and Astronomy; General Engineering; General Materials Science
Abstract :
[en] Dielectric materials are ubiquitous in optics, electronics, and materials science. Recently, there have been new efforts to characterize the dielectric performance of thin films composed of molecular assemblies. In this context, we investigate here the relationship between the polarizability of the constituent molecules and the film dielectric constant, using periodic density functional theory (DFT) calculations, for polyyne and saturated alkane chains. In particular, we explore the implication of the superlinear chain length dependence of the polarizability, a specific feature of conjugated molecules. We show and explain from DFT calculations and a simple depolarization model that this superlinearity is attenuated by the collective polarization. However, it is not completely suppressed. This confers a very high sensitivity of the dielectric constant to the thin film thickness. This latter can increase by a factor of 3-4 at reasonable coverages, by extending the molecular length. This significantly limits the decline of the thin film capacitance with the film thickness. Therefore, the conventional fit of the capacitance versus thickness is not appropriate to determine the dielectric constant of the film. Finally, we show that the failures of semilocal approximations of the exchange-correlation functional lead to a very significant overestimation of this effect.
Disciplines :
Physics
Author, co-author :
VAN DYCK, Colin  ;  Université de Mons - UMONS > Faculté des Sciences > Service Chimie Physique Théorique ; Department of Chemistry and the Materials Research Center, Northwestern University , 2145 Sheridan Road, Evanston, Illinois 60208, United States
Marks, Tobin J ;  Department of Chemistry and the Materials Research Center, Northwestern University , 2145 Sheridan Road, Evanston, Illinois 60208, United States
Ratner, Mark A;  Department of Chemistry and the Materials Research Center, Northwestern University , 2145 Sheridan Road, Evanston, Illinois 60208, United States
Language :
English
Title :
Chain Length Dependence of the Dielectric Constant and Polarizability in Conjugated Organic Thin Films.
Publication date :
2017
Journal title :
ACS Nano
ISSN :
1936-0851
eISSN :
1936-086X
Publisher :
American Chemical Society, United States
Volume :
11
Issue :
6
Pages :
5970-5981
Peer reviewed :
Peer Reviewed verified by ORBi
Research institute :
Matériaux
Funders :
Division of Materials Research
Funding text :
Supported by National Science Foundation Grant ACI-1053575.
Available on ORBi UMONS :
since 05 July 2022

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