Profil

Guisbiers Gregory

Main Referenced Co-authors
Wautelet, Michel  (12)
Van overschelde, Olivier  (8)
SNYDERS, Rony  (3)
Abudukelimu, Gulmira (2)
Arscott, Steve (1)
Main Referenced Disciplines
Physics (16)
Electrical & electronics engineering (4)
Chemistry (3)
Materials science & engineering (1)

Publications (total 16)

The most cited

70 citations (Scopus®)

Van Overschelde, O., Guisbiers, G., & Snyders, R. (16 October 2013). Green synthesis of selenium nanoparticles by excimer pulsed laser ablation in water. APL Materials, 1 (1), 042114-7. https://hdl.handle.net/20.500.12907/24651

Van Overschelde, O., Guisbiers, G., & Snyders, R. (16 October 2013). Green synthesis of selenium nanoparticles by excimer pulsed laser ablation in water. APL Materials, 1 (1), 042114-7.
Peer Reviewed verified by ORBi

Guisbiers, G., & Abudukelimu, G. (2013). Influence of nanomorphology on the melting and catalytic properties of convex polyhedral nanoparticles. Journal of Nanoparticle Research.
Peer Reviewed verified by ORBi

Guisbiers, G., Colla, M.-S., Coulombier, M., Raskin, J.-P., & Pardoen, T. (14 January 2013). Study of creep/relaxation mechanisms in thin freestanding nanocrystalline palladium films through the lab-on-chip technology. Journal of Applied Physics, 113.
Peer Reviewed verified by ORBi

Guisbiers, G., Arscott, S., & Snyders, R. (05 December 2012). An accurate determination of the surface energy of solid selenium. Applied Physics Letters, 101.
Peer Reviewed verified by ORBi

Van Overschelde, O., Guisbiers, G., Hamadi, F., Hemberg, A., Snyders, R., & Wautelet, M. (18 November 2008). Alternative to classic annealing treatments for fractally patterned TiO2 thin films. Journal of Applied Physics, 104.
Peer Reviewed verified by ORBi

Guisbiers, G., & Wautelet, M. (03 August 2007). Materials selection for micro-electromechanical systems. Materials and Design, 28.

Guisbiers, G., Van Overschelde, O., & Wautelet, M. (21 March 2007). Nanoparticulate origin of intrinsic residual stress in thin films. Acta Materialia, 55.
Peer Reviewed verified by ORBi

Van Overschelde, O., Guisbiers, G., & Wautelet, M. (2007). Micro-structuring of TiO2 thin films by laser-assisted diffraction processing. Applied Surface Science.
Peer Reviewed verified by ORBi

Guisbiers, G., Van Overschelde, O., Wautelet, M., Leclère, P., & Lazzaroni, R. (02 February 2007). Fractal dimension, growth mode and residual stress of metal thin films. Journal of Physics: D Applied Physics, 40.
Peer Reviewed verified by ORBi

Guisbiers, G., Van Overschelde, O., & Wautelet, M. (25 January 2007). Materials selection for thin films for radio frequency microelectromechanical systems. Materials and Design, 28.
Peer Reviewed verified by ORBi

Abudukelimu, G., Guisbiers, G., & Wautelet, M. (01 June 2006). Theoretical phase diagrams of nanowires. Journal of Materials Research, 21.
Peer Reviewed verified by ORBi

Van Overschelde, O., Dinu, S., Guisbiers, G., Monteverde, F., Nouvellon, C., & Wautelet, M. (30 April 2006). Excimer laser ablation of thin titanium oxide films on glass. Applied Surface Science, 252.
Peer Reviewed verified by ORBi

Guisbiers, G., & Wautelet, M. (24 March 2006). Size, shape and stress effects on the melting temperature of nano-polyhedral grains on a substrate. Nanotechnology, 17.
Peer Reviewed verified by ORBi

Guisbiers, G., Strehle, S., Van Overschelde, O., & Wautelet, M. (2006). Residual stresses in Ta, Mo, Al and Pd thin films deposited by e-beam evaporation process on Si and Si/SiO2 substrates [Paper presentation]. 8th International Workshop on Stress-Induced Phenomena in Metallization, Dresden, Germany.

Guisbiers, G., Strehle, S., & Wautelet, M. (24 August 2005). Modeling of residual stresses in thin films deposited by electron beam evaporation. Microelectronic Engineering, 82.
Peer Reviewed verified by ORBi

Guisbiers, G., & Wautelet, M. (2003). Macro-, micro- et nanosystèmes: des physiques différentes? [Paper presentation]. Congrès français de Thermique, SFT2003, Grenoble, France.

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