Profil

Wautelet Michel


Main Referenced Co-authors
VAN OVERSCHELDE, Olivier  (20)
Guisbiers, Gregory  (12)
Guisbiers, G. (9)
Duvivier, Damien  (3)
LAZZARONI, Roberto  (3)
Main Referenced Keywords
Traduction philosophie (1);
Main Referenced Unit & Research Centers
CIRMAP - Centre d'Innovation et de Recherche en Matériaux Polymères (1)
Main Referenced Disciplines
Physics (27)
Chemistry (17)
Mechanical engineering (15)
Electrical & electronics engineering (3)
Education & instruction (2)

Publications (total 31)

The most downloaded
8 downloads
Guisbiers, G., Van Overschelde, O., & Wautelet, M. (01 June 2007). Nanoparticulate origin of intrinsic residual stress in thin films. Acta Materialia, 55 (10), 3541-3546. doi:10.1016/j.actamat.2007.02.003 https://hdl.handle.net/20.500.12907/23843
The most cited
103 citations (Scopus®)
Guisbiers, G., Kazan, M., Van Overschelde, O., Wautelet, M., & Pereira, S. (22 February 2008). Mechanical and Thermal Properties of Metallic and Semiconductive Nanostructures. Journal of Physical Chemistry. C, Nanomaterials and interfaces, 112 (11), 4097-4103. doi:10.1021/jp077371n https://hdl.handle.net/20.500.12907/10752

Brocorens, P., Dubois, P., Gillis, P., Renoirt, J.-M., Lazzaroni, R., Wautelet, M., Dusoulier, J., Bazet-Simoni, C., Gandin, E., Leboutte, F., & Servigne, P. (2013). Voici venue l'ère du pétrole cher. Le Soir.

Wautelet, M., & D'amelio, N. (2011). Le Principe de précaution en tant que principe de démocratie délibérative dans l'UE. Lansman Editeur.

Van Overschelde, O., Guisbiers, G., & Wautelet, M. (04 August 2009). Nanocrystallisation of anatase or rutile TiO2 by laser treatment. Journal of Physical Chemistry. C, Nanomaterials and interfaces, 113 (34), 15343-15345. doi:10.1021/jp905163j
Peer Reviewed verified by ORBi

VanOverschelde, O., Guisbiers, G., Hamadi, F., Hemberg, A., Snyders, R., & Wautelet, M. (18 November 2008). Alternative to classic annealing treatments for fractally patterned TiO2 thin films. Journal of Applied Physics, 104 (10), 103106-103113. doi:10.1063/1.3021161
Peer Reviewed verified by ORBi

Van Overschelde, O., Guisbiers, G., Hamadi, F., Hemberg, A., Snyders, R., & Wautelet, M. (18 November 2008). Alternative to classic annealing treatments for fractally patterned TiO2 thin films. Journal of Applied Physics, 104.
Peer Reviewed verified by ORBi

Van Overschelde, O., Boisdequin, J. M., Leclère, P., & Wautelet, M. (01 August 2008). Excimer-Laser Induced Structural Transformations of TiO2 Thin Films. Physica Status Solidi C. Current Topics in Solid State Physics, 5 (10), 3255-3258. doi:10.1002/pssc.200779518
Peer Reviewed verified by ORBi

Duvivier, D., Van Overschelde, O., & Wautelet, M. (05 March 2008). Nanogeometry. European Journal of Physics, 29 (3), 467-474. doi:10.1088/0143-0807/29/3/007
Peer Reviewed verified by ORBi

Guisbiers, G., Van Overschelde, O., & Wautelet, M. (01 March 2008). Theoretical investigation of size and shape effects on the melting temperature and energy bandgap of TiO2 nanostructures. Applied Physics Letters, 92 (10), 103121-3. doi:10.1063/1.2897297
Peer Reviewed verified by ORBi

Guisbiers, G., Kazan, M., Van Overschelde, O., Wautelet, M., & Pereira, S. (22 February 2008). Mechanical and Thermal Properties of Metallic and Semiconductive Nanostructures. Journal of Physical Chemistry. C, Nanomaterials and interfaces, 112 (11), 4097-4103. doi:10.1021/jp077371n
Peer Reviewed verified by ORBi

Van Overschelde, O., Snyders, R., & Wautelet, M. (15 December 2007). Crystallisation of TiO2 thin films induced by excimer laser irradiation. Applied Surface Science, 254 (4), 971-974. doi:10.1016/j.apsusc.2007.08.018
Peer Reviewed verified by ORBi

Guisbiers, G., & Wautelet, M. (03 August 2007). Materials selection for micro-electromechanical systems. Materials and Design, 28.

Van Overschelde, O., Guisbiers, G., & Wautelet, M. (31 July 2007). Micro-structuring of TiO2 thin films by laser-assisted diffraction processing. Applied Surface Science, 253 (Issue 19), 7890-7894. doi:10.1016/j.apsusc.2007.02.072
Peer Reviewed verified by ORBi

Wautelet, M., & Duvivier, D. (30 July 2007). The characteristic dimensions of the nanoworld. European Journal of Physics, 28, 953-959.
Peer Reviewed verified by ORBi

Guisbiers, G., Van Overschelde, O., & Wautelet, M. (01 June 2007). Nanoparticulate origin of intrinsic residual stress in thin films. Acta Materialia, 55 (10), 3541-3546. doi:10.1016/j.actamat.2007.02.003
Peer Reviewed verified by ORBi

Guisbiers, G., Van Overschelde, O., & Wautelet, M. (21 March 2007). Nanoparticulate origin of intrinsic residual stress in thin films. Acta Materialia, 55.
Peer Reviewed verified by ORBi

Van Overschelde, O., Guisbiers, G., & Wautelet, M. (2007). Micro-structuring of TiO2 thin films by laser-assisted diffraction processing. Applied Surface Science.
Peer Reviewed verified by ORBi

Guisbiers, G., Van Overschelde, O., Wautelet, M., Leclère, P., & Lazzaroni, R. (02 February 2007). Fractal dimension, growth mode and residual stress of metal thin films. Journal of Physics: D Applied Physics, 40.
Peer Reviewed verified by ORBi

Guisbiers, G., Van Overschelde, O., & Wautelet, M. (25 January 2007). Materials selection for thin films for radio frequency microelectromechanical systems. Materials and Design, 28.
Peer Reviewed verified by ORBi

Guisbiers, G., Van Overschelde, O., & Wautelet, M. (01 January 2007). Materials selection for thin films for radio frequency microelectromechanical systems. Materials and Design, 28 (Issue 1), 1994-1997. doi:10.1016/j.matdes.2005.05.012
Peer Reviewed verified by ORBi

Van Overschelde, O., & Wautelet, M. (01 October 2006). Diffraction-aided laser-induced microstructuring of thin TiO2 films on glass. Applied Physics Letters, 89 (Issue 16), 161114-3. doi:10.1063/1.2364462
Peer Reviewed verified by ORBi

Abudukelimu, G., Guisbiers, G., & Wautelet, M. (01 June 2006). Theoretical phase diagrams of nanowires. Journal of Materials Research, 21.
Peer Reviewed verified by ORBi

Van Overschelde, O., Dinu, S., Guisbiers, G., Monteverde, F., Nouvellon, C., & Wautelet, M. (30 April 2006). Excimer laser ablation of thin titanium oxide films on glass. Applied Surface Science, 252 (Issue 13), 4722-4727. doi:10.1016/j.apsusc.2005.07.147
Peer Reviewed verified by ORBi

Van Overschelde, O., Dinu, S., Guisbiers, G., Monteverde, F., Nouvellon, C., & Wautelet, M. (30 April 2006). Excimer laser ablation of thin titanium oxide films on glass. Applied Surface Science, 252.
Peer Reviewed verified by ORBi

Guisbiers, G., & Wautelet, M. (24 March 2006). Size, shape and stress effects on the melting temperature of nano-polyhedral grains on a substrate. Nanotechnology, 17.
Peer Reviewed verified by ORBi

Duvivier, D., & Wautelet, M. (22 March 2006). From the microworld to King Kong. Physics Education, 41, 386-390.
Peer Reviewed verified by ORBi

Guisbiers, G., Strehle, S., Van Overschelde, O., & Wautelet, M. (2006). Residual stresses in Ta, Mo, Al and Pd thin films deposited by e-beam evaporation process on Si and Si/SiO2 substrates. Paper presented at 8th International Workshop on Stress-Induced Phenomena in Metallization, Dresden, Germany.

Guisbiers, G., Strehle, S., & Wautelet, M. (24 August 2005). Modeling of residual stresses in thin films deposited by electron beam evaporation. Microelectronic Engineering, 82.
Peer Reviewed verified by ORBi

Van Overschelde, O., & Wautelet, M. (10 June 2005). Self-diffraction in a CCD camera. European Journal of Physics, 26, 15-17. doi:10.1088/0143-0807/26/5/L01
Peer Reviewed verified by ORBi

Guisbiers, G., Strehle, S., Van Overschelde, O., & Wautelet, M. (2005). Residual stresses in Ta, Mo, Al and Pd thin films deposited by E-beam evaporation process on Si and Si/SiO2 substrates. Paper presented at 8th International Workshop on Stress-Induced Phenomena in Metallization, Dresden, Germany.

Guisbiers, G., & Wautelet, M. (2003). Macro-, micro- et nanosystèmes: des physiques différentes? Paper presented at Congrès français de Thermique, SFT2003, Grenoble, France.

Del Re, M., Gouttebaron, R., Dauchot, J.-P., Leclère, P., Lazzaroni, R., Wautelet, M., & Hecq, M. (28 June 2002). Growth and morphology of magnetron sputter deposited silver films. Surface and Coatings Technology, 151-152, 86-90.
Peer Reviewed verified by ORBi

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