Article (Scientific journals)
Assessment of local microscale residual stresses induced by variable uncut chip thickness in turning using large-field FIB-DIC
Ortiz-de-Zarate, Gorka; Chuvilin, Andrey; DUCOBU, François et al.
2026In CIRP Annals
Peer reviewed
 

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Disciplines :
Mechanical engineering
Author, co-author :
Ortiz-de-Zarate, Gorka 
Chuvilin, Andrey 
DUCOBU, François  ;  Université de Mons - UMONS > Faculté Polytechnique > Service de Génie Mécanique
Madariaga, Aitor 
Etxebeste, Mikel
Arrazola, Pedro J. 
Language :
English
Title :
Assessment of local microscale residual stresses induced by variable uncut chip thickness in turning using large-field FIB-DIC
Publication date :
May 2026
Journal title :
CIRP Annals
ISSN :
0007-8506
Publisher :
Elsevier BV
Peer reviewed :
Peer reviewed
Research unit :
F707 - Génie Mécanique
Research institute :
R400 - Institut de Recherche en Science et Ingénierie des Matériaux
Funders :
State Agency of Research
Gobierno de España Ministerio de Ciencia e Innovación
Basque Government
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