Chemical and microstructural characterizations of plasma polymer films by time-of-flight secondary ion mass spectrometry and principal component analysis
Cossement, D.; Renaux, F.; Thiry, D.et al.
2015 • In Applied Surface Science, 355, p. 842-848
Snyders, Rony ; Université de Mons > Faculté des Sciences > Chimie des Interactions Plasma-Surface
Language :
English
Title :
Chemical and microstructural characterizations of plasma polymer films by time-of-flight secondary ion mass spectrometry and principal component analysis
Publication date :
15 November 2015
Journal title :
Applied Surface Science
ISSN :
0169-4332
eISSN :
1873-5584
Publisher :
Elsevier, Netherlands
Volume :
355
Pages :
842-848
Peer reviewed :
Peer Reviewed verified by ORBi
Research unit :
S882 - Chimie des Interactions Plasma-Surface
Research institute :
R400 - Institut de Recherche en Science et Ingénierie des Matériaux
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