Built-In Oscillation-Based Self-Testing of a 2.4 GHz LNA in 0.35μm CMOS

Jerraya, A. A.; Romdhani, M.; Le Marrec, Ph.; Hessel, F.; Coste, P.; Valderrama, Carlos; Daveau, M.; Zergainoh, N-E.

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Built-In Oscillation-Based Self-Testing of a 2.4 GHz LNA in 0.35μm CMOS

Jerraya, A. A.; Romdhani, M.; Le Marrec, Ph. et al.

2018

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https://hdl.handle.net/20.500.12907/42173

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Details

Research center :

CRTI - Centre de Recherche en Technologie de l'Information

Disciplines :

Electrical & electronics engineering

Author, co-author :

Jerraya, A. A.

Romdhani, M.

Le Marrec, Ph.

Hessel, F.

Coste, P.

Valderrama, Carlos

Daveau, M.

Zergainoh, N-E.

Language :

English

Title :

Built-In Oscillation-Based Self-Testing of a 2.4 GHz LNA in 0.35μm CMOS

Publication date :

09 December 2018

Event name :

IEEE International Conference on Electronics Circuits and Systmems

Event place :

Bordeaux, France

Event date :

2018

Publisher :

Springer Netherlands

Additional URL :

http://link.springer.com/content/pdf/10.1007/978-94-011-4698-2_3.pdf

Research unit :

F109 - Electronique et Microélectronique

Research institute :

R450 - Institut NUMEDIART pour les Technologies des Arts Numériques

Name of the research project :

Development of self-testing techniques for microwave microelectronics in harsh environment - Fédération Wallonie Bruxelles

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since 23 December 2018

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